Optimizing disk registration algorithms for nanobeam electron diffraction strain mapping
نویسندگان
چکیده
منابع مشابه
Misorientation Mapping for Visualization of Plastic Strain via Electron Back-scattered Diffraction
The ability to map elastic or plastic strain on a microstructural level is critical to understanding and controlling deformation in structural alloys and ceramics. Electron back-scattered diffraction (EBSD) and related techniques, such as electron channeling patterns, have been used with some success to measure the plastic strain around cracks in Fe-3Si single crystals [1], Cu single crystals [...
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ژورنال
عنوان ژورنال: Ultramicroscopy
سال: 2017
ISSN: 0304-3991
DOI: 10.1016/j.ultramic.2016.12.021